BXCOM: a software for computation of radiation sensing” isimli Çalışması “Science Citetion Index (SCI)” taranan Radiation Effects and Defects in Solids Dergisinde yayınlanmıştır (https://www.tandfonline.com/doi/full/10.1080/10420150.2019.1606811)
Önder Eyecioğlu, A. M. El-Khayatt, Yaşar Karabul, Mustafa Çağlar, Ozan Toker & Orhan İçelli (2019) BXCOM: a software for computation of radiation sensing, Radiation Effects and Defects in Solids, 174:5-6, 506-518, DOI: 10.1080/10420150.2019.1606811
The main objective of this work is to develop user-friendly software, called BXCOM, for computation of the exposure build-up factor (EBF) and the energy absorption build-up factor (EABF), using geometric progression (G-P) fitting method for element, compound or mixture in the energy region 0.015-15 MeV, and for penetration depths up to 40 mean free path (mfp). Furthermore, BXCOM can generate the equivalent atomic number ? and five fitting parameters used in the G-P method for mixtures and compounds over an interval of photon energies extended from 0.015 to 15 MeV. In addition, the program is designed to calculate the effective atomic number ? and effective electron number ? via the direct method. BXCOM program has been verified by comparing its results with approved data by American National Standards Institute. BXCOM runs under MS Windows® operating system. It has an improved user interface that provides examination of material's radiation interaction parameters. Finally, BXCOM allows rapid and reliable calculation of many γ-ray interaction parameters such as ?, ?, ?, G-P fitting parameters and build-up factors that are essential in a wide range of applications such as radiation shielding, radiotherapy, technology and so on.
Radiation Effects and Defects in Solids, Volume 174, Issue 5-6, p.506-518
Pub Date: June 2019
DOI: 10.1080/10420150.2019.1606811 Bibcode: 2019REDS..174..506E Keywords:
Energy absorption build-up factor; exposure build-up factor; BXCOM; softwareRelease date: 13.10.2020 - 14:45:59